5-in-1: Innovative analytical tools for electron microscopes

Bruker presents a new variety of choice in instrumentation by expanding its portfolio for materials characterization

With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM.

Another step ahead is the new 4-in-1 software ESPRIT 2.0., which seamlessly integrates EDS, EBSD, WDS and Micro-XRF under a single user interface and allows researchers to combine data obtained by these complementary methods.

Besides this unparalleled range of analytical tools for electron microscopes, Bruker also offers a variety of X-ray fluorescence micro analyzers for spatially resolved composition analysis and for trace element analysis for a multitude of applications in industry and research.

Contact:

Bruker Nano GmbH
Am Studio 2D
12489 Berlin

Tel.: +49 (30) 67 09 90-0, Fax: -30
Email: info(at)bruker-nano.de